Semiconductor Testing Basics - Basic Concepts
原文中文,约4300字,阅读约需11分钟。发表于: 。Semiconductor Testing Basics - Basic Concepts As chip integration increases, manual testing is no longer sufficient, so automated test equipment (ATE) is used. Because chips are becoming...
本文介绍了半导体测试基础的概念,包括ATE的作用和内部子系统,测试系统的组成,信号的格式和常用术语,测试参数,热切换,闩锁效应,固定型故障和Binning等。测试流程的设计对整个测试很重要。